1 article(s) from Lendlein, Andreas

An ellipsometric approach towards the description of inhomogeneous polymer-based Langmuir layers

  • Falko O. Rottke,
  • Burkhard Schulz,
  • Klaus Richau,
  • Karl Kratz and
  • Andreas Lendlein

Beilstein J. Nanotechnol. 2016, 7, 1156–1165, doi:10.3762/bjnano.7.107

Graphical Abstract
PDF
Album
Full Research Paper
Published 08 Aug 2016
 
Other Beilstein-Institut Open Science Activities